C H A P T E R  16

Sun StorEdge A5x00 Test (enatest)

enatest is used to provide configuration verification, fault isolation, and repair validation of the Sun StorEdgetrademark A5x00 subsystem. The enatest tests Sun StorEdge models A5000 (14 slot disk array) and A5200 (22 slot disk array).

The Sun StorEdge A5x00 is a high availability mass storage subsystem consisting of:



Note - Do not run enatest and socaltest at the same time, otherwise test failures might occur.





Note - The Sun StorEdge A5x00 was formally known as the Sun Enterprise Network Arraytrademark. The enatest tests both of these disk array subsystems.



enatest detects all Sun StorEdge A5x00 enclosures connected to the host and collects relevant configuration information. FIGURE 16-1 shows the Test Parameter Options menu which contains a sample configuration listing and test parameters. describes the extent of the test coverage and provides samples of the configuration information that is displayed.

TABLE 16-1 enatest Coverage

Test Coverage

Description

Host Connections

enatest searches for all the active and inactive connections between the host and the enclosure and reports the number of existing active connections. If the VERBOSE mode is enabled, the port on the host side and the GBIC port on the enclosure side is reported for each active connection. The test also diagnoses any inactive connection(s) and reports the possible causes for the failure. The test will fail if there are one or more inactive connections. See the section on enatest Fault Isolation Capability for more information.

Sample Output, for an enclosure attached to an SBus socal card:

SUNWvts.enatest.1010 06/05/97 13:48:53 enatest ses0 VERBOSE:

"MYBOX: Lower-Right GBIC connected to host via /devices/sbus@1f,0/SUNW,socal@0,0:1"

SUNWvts.enatest.1006 06/05/97 13:48:53 enatest ses0 VERBOSE:

"MYBOX: Interface Board (Bottom one in the enclosure) detected to be installed

and OK"

SUNWvts.enatest.6023 06/05/97 13:48:53 enatest ses0

ERROR: "MYBOX: Cannot communicate with the enclosure via

/devices/sbus@1f,0/SUNW,socal@0,0:0; possibly connected to Lower-Left

GBIC in the enclosure"

Probable_Cause(s):

(1)Signal too low at the GBIC module in the enclosure

(2)Faulty cable or cable disconnected

(3)Faulty GBIC module on the host side

Recommended_Action(s):

(1)Ensure the cables are properly connected

(2)Please contact your service representative

SUNWvts.enatest.2006 06/05/97 13:48:53 enatest ses0 INFO:

"MYBOX: Number of connections to the host: 1"

Disk Access

During the testing, each disk is accessed through each active connection leading to that disk. The enatest opens partition 2 on the disk and reads 512 bytes of raw data. If there are any failures, the test tries to isolate the fault to either an enclosure element, the cable, the host adapter card, or the OE module on the host adapter. See the section on enatest Fault Isolation Capability for more information.

Enclosure Status

The status of the enclosure is obtained by querying the SCSI Enclosure Services (SES) device in the enclosure. Detailed information regarding the status of the elements within the enclosure is reported. The test fails if a critical condition is detected in the enclosure. The table below shows how the status information is reported.


TABLE 16-2 Element Enclosure Status

Enclosure Element

Information

Disk

  • Fault Sensed--Yes/No

  • Status of ports A and B--Connected or Bypassed

Power Supply

  • Status--ON/OFF

  • Temperature--OK/Critical Overtemp/Abnormal

  • AC Input--OK/Not OK

  • DC Output--OK/Not OK

Fan

  • Status--On/Off

  • Speed--High/Low/Stopped

Backplane

  • Status--OK/Failed

  • Status of ports A and B--Connected/Bypassed

Interface Board

  • Temperature--OK/Critical Overtemp

  • Loop A status--OK/Failed

  • Loop B status--OK/Failed

GBIC

  • Status--Disabled/Enabled

  • Signal Level--OK/Too low

  • Transmitter--OK/Failed



enatest Options

To reach the dialog box below, right-click on the test name in the System Map and select Test Parameter Options. If you do not see this test in the System Map, you might need to expand the collapsed groups, or your system may not include the device appropriate to this test. Refer to the SunVTS User's Guide for more details.

FIGURE 16-1 enatest Test Parameter Options Dialog Box

Screenshot of the enatest Test Parameter Options dialog box.

TABLE 16-3 enatest Options

enatest Options

Description

Enclosure Services Functional test

(general description)

Certain control operations are performed on devices in the enclosure through the SES device and verified that the operation was performed successful. This functional test involves the following steps:

  1. Perform control operation.

  2. Verify control operation was successful.

  3. Restore state to what it was before 1.

  4. Verify restore operation was successful.

The test will fail if any one of the above steps fails.

This test targets the disks and the fans in the enclosure.

Enclosure Services Functional test

(detailed Disk test description)

  1. Control Operation--Each port of the disk is toggled from its original state. A port that was originally connected will be bypassed and vice-versa.

  2. Verify Control Operation--This is done in two ways. First, the new status of the disk ports is verified by reading the status through the SES device. The test will fail if the status read back does not reflect the change. Next, disk access is attempted through the port that was originally connected but has now been bypassed. The test will fail if the access attempt is successful.

  3. Restore State--The port states are restored to what they were before the Control Operation.

  4. Verify Restore Operation--This is done in two ways. First the status of the disk ports is verified by reading the status through the SES device. The test will fail if the status read back does not reflect the change. Next, disk access is attempted through the port that have been reconnected. The test will fail if the access attempt is unsuccessful.

Enclosure Services Functional test (detailed Fan test description)

  1. Control Operation--The speed of each fan is toggled. Possible speeds are HIGH and LOW.

  2. Verify Control Operation--The status is read back through the SES device and the speeds are compared. Failure to vary the speed in this case will result in an INFO message indicating that the fan speed could not be changed but does not result in a test failure. This is because SES can ignore fan speed change requests if required because of existing ambient temperature conditions.

  3. Restore State--Restore the fan speed to the original speed.

  4. Verify Restore Operation--This is similar to the Verify Control Operation step above.



enatest Fault Isolation Capability

In the case of a failure, the test aids in fault isolation by reporting the possible cause(s) of failure. The fault isolation capability varies depending on the nature of the fault and the system configuration. enatest can detect and isolate hard faults. The following table shows the fault isolation capability for different configurations. A Yes indicates that fault isolation capability is available for that component in that configuration and a No indicates lack of fault isolation capability for that component in that configuration.

The following table is not applicable when using the PCI-based Fibre Channel card due to the card's lack of fault isolation capabilities.

TABLE 16-4 enatest Fault Isolation Configurations

Connections to Enclosure

System Architecture

SOC+ Host Adapter

Host Side GBIC or Cable

Enclosure Elements

Disk

Backplane

IB

GBIC

Multiple

sun4u

Yes

Yes

Yes

Yes

Yes

Yes

Multiple

sun4d

Yes

No

Yes

Yes

No

No

Single

sun4u

Yes

No

No

No

No

No

Single

sun4d

Yes

No

No

No

No

No



enatest Test Modes
TABLE 16-5 enatest Supported Test Modes

Test Mode

Description

Connection test

In this mode, the host connections and the status of the enclosure are checked. The test fails if there are any broken connections or if a critical enclosure condition is detected.

Noncritical conditions result in a warning. A sample of the output follows.

Connection test starting....

ses0

Status: Connected

Enclosure:

Product Anemones Enterprise Network Array,

Enclosure Name=MYBOX,

Host Connections:

Number of Active Connections=2,

Enclosure State:

Critical Conditions=None, Non-Critical Conditions=None

Connection test complete

Functional

(offline)

All test options are allowed in this mode.



enatest Command-Line Syntax

/opt/SUNWvts/bin/enatest standard_arguments -o dev=device_name, disk_access=enable|disable,disks=disk1:disk2:disk3:...diskn,disp=enable|disable, esfunc=enable|disable,conn=enable|disable,delay=delay_in_seconds

TABLE 16-6 enatest Command-Line Syntax

Argument

Description

dev=device_name

Specifies the name of an ses device in the enclosure.

disk_access=enable|disable

Enables or disables disk access.

disks=disk1:disk2:disk3:... diskn

Lists the disks contained in this enclosure that the disk_access test should attempt to access. The disk names are separated by colons (:). If this option is disabled, the test will access all disks found in the enclosure.

disp=enable|disable

Enables or disables the display of detailed status information regarding the enclosure elements.

esfunc=enable|disable

Enables or disables the Enclosure Services Functional test.

conn=enable|disable

Displays information about the connection to the host.

delay=delay_in_seconds

Sets the minimum delay (in seconds) between successive invocations of the test.




Note - 64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to 32-Bit and 64-Bit Tests.