17 - C H A P T E R -

C H A P T E R 17

Sun StorEdge 1000 Enclosure Test (enctest)

enctest tests the Sun StorEdge trademark A1000, D1000, and D2 disk enclosures. The A1000 and D1000 enclosures can support either 12 1" 4GB drives or 8 1.6" 9GB drives. The D2 disk enclosure can support 12 1" either 18GB or 36GB drives. These disk enclosures have redundant power and cooling. Following enclosure models are supported by enctest:

Sun StorEdge A1000--Disk tray with the hardware RAID controller

Sun StorEdge D1000--Disk tray without the hardware RAID controller

Sun StorEdge D2--Disk tray without the hardware RAID controller

enctest can be used for validation, configuration verification, repair verification, and fault isolation of these models.

enctest sets the disk enclosure LEDs as follows:

TABLE 17-1 `enctest` Status LEDs
LED State	Indicated Condition
On	Unrecoverable or critical condition
Blinking	Non-critical condition
Off	Informational or no condition to report

Note - The ses driver must be present on the system with the Sun StorEdge enclosure(s). If the ses driver is not present, SunVTS will not detect the Sun StorEdge hardware. Use the following command to see if the ses driver is present:
pkginfo SUNWsesInstall the package if necessary.

enctest reports the status of the various elements in the enclosure. An error is registered if an unrecoverable or critical condition is detected. Noncritical conditions are reported through warning messages. The table below describes the information that is reported for each enclosure element.

TABLE 17-2 `enctest` Enclosure Status Report
Enclosure Element	Information reported (per device slot)
Disk	Present/Not Present Failed/OK
Power supply	Present/Not Present Failed/OK
Fan	Present/Not Present Failed/OK
Temperature	OK/Over temperature
RPA cache Battery (StorEdge A1000 only)	OK/Low Charge

enctest Options

To reach the dialog box below, right-click on the test name in the System Map and select Test Parameter Options. If you do not see this test in the System Map, you might need to expand the collapsed groups, or your system may not include the device appropriate to this test. Refer to the SunVTS User's Guide for more details.

FIGURE 17-1 enctest Test Parameter Options Dialog Box

Screenshot of the enctest Test Parameter Options dialog box.

TABLE 17-3 `enctest` Options
`enctest` Options	Description
Display Enclosure Status	When enabled, the status of the enclosure elements are displayed as messages in the SunVTS console. These messages are also logged in the SunVTS info log file.
LED Test	When enabled, the LEDs associated with the disks are flashed for a short period of time.
Interval Between Passes	Sets the minimum delay between successive invocations of the test.

enctest Test Modes

TABLE 17-4 `enctest` Supported Test Modes
Test Mode	Description
Connectivity	The enclosure status summary bits are read. Detailed information is reported only if an unrecoverable or critical condition is detected.
Functional (Offline)	All options are allowed.

enctest Command-Line Syntax

/opt/SUNWvts/bin/enctest standard_arguments -o dev=device_name, disp=enable|disable,led=enable|disable,delay=delay_in_seconds

TABLE 17-5 `enctest` Command-Line Syntax
Argument	Description
`dev=`device_name	This is the name of a `ses` device in the enclosure.
`disp=`enable\|disable	Detailed status information regarding the enclosure elements will be displayed if enabled.
`led=`enable\|disable	Option to enable or disable the LED test.
`delay=`delay_in_seconds	Minimum delay between successive invocations of the test.

Note - 64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to 32-Bit and 64-Bit Tests.