Sun Netra Alarm Card Test (nalmtest)
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nalmtest is designed to test the alarm card on Sun Netra 240 and Sun Netra 440 servers.
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Note - The Sun Netra Alarm Card Test (nalmtest) was previously titled Sun Netra 240 Alarm Card Test (n240atest) in SunVTS 5.1 PS5. The reason for this change is that this test now supports the Sun Netra 440 alarm card in addition to the Sun Netra 240 alarm card.
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Caution - Solaris 8 2/02 operating environment or later is required to perform the nalmtest.
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nalmtest Options
To reach the dialog box below, right-click on the test name in the System Map and select Test Parameter Options. If you do not see this test in the System Map, you might need to expand the collapsed groups. Refer to the SunVTS User's Guide for more details.
FIGURE 22-1 nalmtest Test Parameter Options Dialog Box
The following table describes the nalmtest options:
TABLE 22-1 nalmtest Options
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nalmtest Options
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Description
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Alarm Critical
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Toggles the Alarm critical LED.
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Alarm Major
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Toggle the Alarm critical Major.
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Alarm Minor
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Toggles the Alarm critical Minor.
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Alarm User
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Toggles the Alarm critical User.
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Alarm FRUID
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Performs the FruID checksum test on the alarm card.
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Loop Count
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Sets up the loop count for toggling all four alarm LEDS. The count number is 1 to 3.
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nalmtest Test Modes
TABLE 22-2 nalmtest Supported Test Modes
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Test Mode
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Description
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Connection
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The test determines if the devices are connected to the system you are testing and verifies that they are accessible. Device functionality is not verified; however, you can safely run connection mode tests while the system is offline.
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Functional
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Tests fully exercise all aspects of the device through the associated device drivers. These tests use a significant portion of the system resources and assume that the device is available for testing. For this reason, the system must be offline with no other users or application running. This mode is sometimes referred to as Offline mode.
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nalmtest Command-Line Syntax
/opt/SUNWvts/bin/sparcv9/nalmtest standard_arguments [ -o
[ dev=<device_name> ][ cri=<E(nable)|D(isable)> ][ maj=<E|D> ][ min=<E|D> ][ usr=<E|D> ][ fru=<E|D>][ count=<count_number>] ]
TABLE 22-3 nalmtest Command-Line Syntax
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Argument
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Description
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dev
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Specifies the name of the raw device to test.
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cri
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Toggles the Alarm critical LED.
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maj
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Toggles the Alarm critical Major.
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min
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Toggles the Alarm critical Minor.
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usr
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Toggles the Alarm critical User.
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fru
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Performs FruID checksum test on the alarm card.
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count
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Sets up the loop count for toggling all four alarm LEDS count_number is 1 to 3.
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Note - 64-bit tests are located in the sparcv9 subdirectory: /opt/SUNWvts/bin/sparcv9/testname. If a test is not present in this directory, then it may only be available as a 32-bit test. For more information refer to the "32-Bit and 64-Bit Tests" section of the SunVTS 5.1 Test Reference Manual (816-5145-10).
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| SunVTS 5.1 Patch Set 6 Documentation Supplement
| 817-6318-10
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Copyright © 2004, Sun Microsystems, Inc. All rights reserved.